Breakthrough Physical Limits : DDR/UFS Interposer Solution
The stability and performance of systems such as AIoT, automotive electronics, mobile devices, and servers critically depend on the signal integrity (SI) and electrical characteristics of high-speed interfaces such as DDR and UFS.
We provide not only standard compliance testing, but also engineering-based measurement analysis and improvement recommendations from early design, debugging stages, to pre-production validation.
Contact Our ConsultantsMeasurement Location Determines Data Value
“As form factors shrink, traditional high-speed test points are disappearing.”
With highly integrated designs, PCB space is extremely constrained. Facing high-density BGA packages and multilayer board structures, even with advanced instruments, it is difficult to acquire true PHY signals without affecting system characteristics.
Hidden risks of conventional methods:
Flying leads, probes, or temporary test points alter the original impedance and channel behavior, causing measured waveforms to deviate from the system’s true condition.
Our solution:
A customized high-speed interposer provides direct, non-intrusive measurement access at the component interface.
Without requiring any PCB modification, it captures waveforms that accurately represent the system’s true operating condition.
Three Key Advantages of the Solution
Non-intrusive, precise probing
Ultra-thin design minimizes parasitic effects and ensures data consistency with the real system
Breakthrough in physical space limitations
Designed for BGA packages and multilayer boards, the interposer can expose critical test points within confined assembly environments.
Comprehensive interface support
Purpose-built for high-density BGA designs, supporting the latest standards including DDR5, LPDDR5, and UFS.
Supported interfaces: DDR3 / DDR4 / DDR5 / LPDDR4 / LPDDR5 / eMMC / UFS
DDR Electrical Signal and Timing Validation
Electrical and timing validation of DDR / LPDDR memory according to JEDEC specifications to identify the root causes of system instability.
Supported standards: DDR3 / DDR4 / DDR5 / LPDDR4 / LPDDR5
Validation items:
• CK / DQS / DQ timing margin analysis
• Read / Write data eye measurement
• Complete setup / hold time verification
• In-depth SI analysis at both DRAM and SoC sides
• Electrical signal comparison and validation for second-source components
High-Speed Storage Interface Electrical Measurement
Supported standards: eMMC / UFS
eMMC 5.1 validation:
Electrical characteristic measurements for HS200 / HS400 modes.
UFS 3.1 / 4.0 validation:
TX electrical compliance testing for M-PHY high-speed gears.
Standardized Test Flow
- Test requirement and specification confirmation
- Fixture and measurement point planning
- High-speed oscilloscope and professional software measurement
- Signal analysis and Root cause localization
- Complete report with design improvement recommendations
- Re-validation after modification (Debug support)
Why Choose Allion ?
- Customized test solutions, not limited to standard compliance testing
- Support for both early design validation and pre-production validation
- Provide engineering-valuable improvement direction, not just test data
- Extensive practical experience with high-speed interfaces
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